审稿意见-晶体数据的“真实分辨率”
审稿意见-晶体数据的“真实分辨率”
最近遇到不少小伙伴的审稿意见是关于晶体数据的“真实分辨率”的,本文以实际文献案例展示如何判断晶体数据的真实分辨率以及在平常的数据处理中应当如何处理这一问题。
案例文献:Dalton Trans., 2023, DOI: 10.1039/D3DT02460A
论文主页:https://pubs.rsc.org/en/content/articlelanding/2023/DT/D3DT02460A
具体审稿意见如下:
Structure 4 (CCDC 2262742): C23 H32 Cl2 Co N2
- The I/sigma drops below 3 at ~2theta = 45. The data should be truncated here and a note added to the experimental.
Structure 230222d-iPr-NH (CCDC 2262744): C30 H46 Cl4 Co N2
- Looking at the HKLF instruction it seems that the cell has been changed after the initial integration, the data should really be reintegrated in the correct cell. This may also help to improve the Rint. Again the I/sigma drops below 3 at ~2theta = 45, if this remains the case after reintegration the data should be truncated here and a note added to the experimental.
上述有关两个晶体数据的审稿意见红色部分均为有关晶体数据真实分辨率的部分。大意是信噪比(I/sigma,或表示为I/σ)在2theta = 45时低于3(即2θ角大于等于45°时信噪比开始小于3)。有关2θ角与分辨率(Å)之间的关系可查看推文“单晶X射线的分辨率”。
关于信噪比分布,在Olex2[1]中可按图1或图2方式查看I/sigma vs resolution图(横轴为2θ角,纵轴为信噪比I/σ(I)),如图3所示(CCDC 2262744投稿时的数据)。



图3中有一条红色横线(信噪比阈值线)“3 sigma line (noise below, data above)”,高于该线的为数据(data)——即图中的绿色方块,低于该线的为噪音(noise)——即图中红色方块。从图中可以看出,2θ角从大约46.602°开始到55.1°(图1)范围均为噪音,也就是审稿人说的“The I/sigma drops below 3 at ~2theta = 45.”。
另外也可以查看xprep中的统计结果,如图4所示。

从图4可以看出,分辨率壳层(resolution shell)0.91−0.89的平均信噪比(mean I/s)为3.25,而0.89−0.87则以将为2.80。若以信噪比3为阈值,则分辨率可截断到0.89 Å;若以信噪比2为阈值,则分辨率可截断到0.83 Å。
这部分内容亦可参考推文“晶体日记(十四)-真实的数据质量(1)”。
在精修阶段分辨率可以使用OMIT指令(见推文“SHELXL指令之OMIT”)或SHEL指令(见推文“SHELXL指令之SFAC和SHEL”)进行截断,如图5和图6所示。


从图5–6可以看出,虽然用OMIT或SHEL指令截断了分辨率(0.84 Å,即2θ角为50°),但I/sigma vs resolution图中仍然能够显示到55.1°的2θ角范围,这是因为精修中这两个指令只是从精修中排除了指定范围的数据,而不是对hkl文件进行编辑。采用这种指令截断分辨率的方法不知是否可以满足审稿人的要求。
不过审稿人明确要求重新还原数据的时候将分辨率截断到合适的值。
Structure 230222d-iPr-NH (CCDC 2262744): C30 H46 Cl4 Co N2
- Looking at the HKLF instruction it seems that the cell has been changed after the initial integration, the data should really be reintegrated in the correct cell. This may also help to improve the Rint. Again the I/sigma drops below 3 at ~2theta = 45, if this remains the case after reintegration the data should be truncated here and a note added to the experimental.
在APEX4中[2],在Reduce Data>>Integrate Images中Resolution Limit [Å]处将分辨率截断到合适值,如图7所示。完整数据还原过程参见推文“布鲁克单晶数据还原操作步骤”。

在APEX4中重新还原数据并截断分辨率(0.84 Å,2θ = 45°,采取的是信噪比大于2的阈值)后,各项参数如图8所示。

审稿意见回复:
Structure 4 (CCDC 2262742): C23 H32 Cl2 Co N2
- The I/sigma drops below 3 at ~2theta = 45. The data should be truncated here and a note added to the experimental.
Answer: Effective data standards (I/sigma above 2) were applied to the new data integration process, thus the data were truncated by 0.84 Å (2θ = 50°). The new cif file have been updated in CCDC.
CCDC 2262744则截断至0.91 Å(2θ = 45.8°,采取的是信噪比大于2的阈值),如图9所示。

相关审稿意见回复:
Structure 230222d-iPr-NH (CCDC 2262744): C30 H46 Cl4 Co N2 (对应编号230222d-ok)
- Looking at the HKLF instruction it seems that the cell has been changed after the initial integration, the data should really be reintegrated in the correct cell. This may also help to improve the Rint. Again the I/sigma drops below 3 at ~2theta = 45, if this remains the case after reintegration the data should be truncated here and a note added to the experimental.
Answer: Effective data standards (I/sigma above 2) were applied to the new data integration process, thus the data were truncated by 0.91 Å (2θ = 45°). The new cif file have been updated in CCDC.
当然,分辨率截断后,可能会出现相关的AB类警报。例如CCDC 2262744就出现了如图10所示的A类警报。

有AB类警报并不意味着数据无法发表,只要能对相应警报给出合理解释即可。例如本例中图10所示A类警报是因为晶体在测试条件下的极限分辨率只有0.93 Å左右,所以在数据还原时将数据分辨率截断至0.93 Å,此时theta_max为22.907(如图11所示),代入sin(theta_max)/wavelength = sin(22.907)/0.71073 = 0.5477,该值小于0.550,所以引起图10所示警报。

在进行数据还原的时候,可能被教的是:钼靶数据分辨率截断至0.77 Å,铜靶数据分辨率截断至0.83 Å这样的一刀切策略。然而,实际上每个晶体的衍射分辨率极限是千差万别的,有些晶体可能衍射分辨率根本达不到0.77 Å这么高,例如本例中的CCDC 2262744极限分辨率只能到0.93 Å左右,而CCDC 2262742极限分辨率勉强能到0.84 Å,如果这两个数据都按照0.77 Å的分辨率进行截断,那么数据就包含很多噪音,从而降低其真实性,或者说使数据的可靠性大打折扣。而有些晶体的极限分辨率明明可以高于0.77 Å(钼靶最高分辨率为0.71073/2 = 0.36 Å),但却截断至0.77 Å,那也不太合适,毕竟人们追求的就是尽可能高的分辨率。
参考文献:
[1] Dolomanov, O. V.; Bourhis, L. J.; Gildea, R. J.; Howard, J. A. K.; Puschmann, H. OLEX2: A complete structure solution, refinement and analysis program. J. Appl. Cryst. 2009, 42, 339–341.
[2] Bruker (2016). APEX4. Bruker AXS Inc., Madison, Wisconsin, USA.
视频见:https://www.bilibili.com/video/BV1mm4y1T7Tq/?spm_id_from=333.999.0.0