STAR TECH INSTRUMENTS 紫外光源激光深紫外极紫外
2021-06-11 13:11 作者:brightzhh163 | 我要投稿
STAR TECH INSTRUMENTS 紫外光源激光深紫外极紫外
Star Tech Instruments is the world leader in X-ray, EUV, DUV and UV light and beam Analysis. We specialize in offering unique solutions and reliable measurements from 1 - 410 nm with vacuum capabilities to 10 -10 torr. and NIST traceability from 5 nm – 405 nm.
High Resolution
Wide Field of View
NIST Traceable
n-line measurements
High Damage Threshold
High Linearity
Real-time measurements
Polarization Insensitive
Beam Uniformity
Vacuum compatibility to 10-10 torr
1 Billion+ pulses
Beam Profile and Image Analysi Intensity Distribution
High Resolution
Wide, Flat, Field of View
Polarization Insensitive
High Damage Threshold
High Damage Threshold
1 Billion+ pulses
Vacuum compatibility to 10-10 torr
Multiple camera formats from .3 to 1.2
Optional NIST traceability
Accessories
RA-45 beam splitters
UV conversion windows
